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As an important surface analysis method, X-ray photoelectron spectroscopy (XPS) can perform qualitative and quantitative analysis on the elemental composition and chemical state of the sample surface. Now it has been widely used in scientific research and industrial production. In previous online lectures, we explained “XPS/UPS/LEIPS fundamental review and technologies features with applications”, “XPS instrumentation, sample preparation and transportation”, “XPS data interpretation and how to use MultiPak” and “XPS instrument daily maintenance & troubleshooting” to everyone. These lectures received widespread attention and praises.  To have a job well done, a workman must have his tools in excellent condition. We will start a new series of 30 minutes online lectures, sharing the unique tips of advanced XPS technology to you.

Learning how to understand the structure-effect relationship of the microscopic scale is the key of improving material and device performance, which is also focus of current research. In scientific research and failure analysis, it is found that surface of the material does not exist uniformly on the micro scale, but is the localization of the active area. Therefore, micro-region analysis is particularly important for truly understanding the structure-effect relationship. Conventional XPS analysis usually uses X-ray beam spots of hundreds of microns to obtain average information on the sample surface, which is difficult to analyze localized features.  How to accurately locate the local feature structure is a prerequisite for microanalysis.

In this online lecture series, we will focus on the precise navigation tool of XPS microanalysis-SXI (X-ray induced secondary electron images): SXI and XPS have the same origin, same optical path, and the same detector, which can ensure accurate positioning of the analysis point with no error and can observe the surface contamination and topographic features that are difficult to detect by the optical system. Through SXI imaging, it can be used to define point analysis, multiple analysis points, line analysis and area analysis on the region of interest.

During this online lecture, we actively interacted with audiences while explaining the knowledge which has received widespread attention. Please keep following PHI CHINA.  More information and knowledge about XPS tips are coming soon.

You may watch back the online lecture video > Technical video