News & Event

To all the teachers, specialists and users:

CoreTech is going to have a Webinar on the Instrument.com.cn. The speaker is Wensly Yip from our company. The Webinar is about Easy Peak Identification for TOF-SIMS Molecular Imaging by Simultaneous Tandem MS Imaging. Please feel free to join the Webinar.

The details of the Webinar are as below:

　　　　　　　　　　　　　　　　　　　Date: 02 December, 2016 (Friday)

　　　　　　　　　　　　　　　　　　　Time: 10:00 am to 11:30 am

　　　　　　　　　　　　　　　　　　　Topic: Easy Peak Identification for TOF-SIMS Molecular Imaging by Simultaneous Tandem MS Imaging

Webinar description:

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is widely used in industrial fields such as impurity analysis of semiconductors, analysis of high technology micro scale materials, and mass spectrometry of polymer and organic materials. Despite dramatic improvements in surface sensitivity and the resulting measureable spatial resolution, the unique identification of each detected mass peak within the mixture of additives and polymer compositions on the surface of real polymer samples has remained problematic. In order to solve this problem, we have developed the TOF-SIMS instrument equipped with tandem MS (MS/MS), and applied it to the various kinds of organic materials. From simplified MS/MS spectrum, the spectrum interpretation is much easier than before. In this tutorial, we will introduce our unique instrument, and demonstrate its capabilities.

If you are interested, please feel free to join the Webinar at http://www.instrument.com.cn/webinar/meeting/meetingInsidePage/2218.

CoreTech Integrated Limited

ULVAC-PHI Incorporated