News & Event

China Surface Analysis and Application Conference 2014 has been successfully held at Hongwa Hotel in Sichuan University, Chengdu on August 29 & 30.

CoreTech Integrated (Beijing) Limited have attended the conference and invited Mr Shibasaki and Mr Sanada, specialists from ULVAC-PHI, Inc. to join this event.  We have set up a booth at the meeting venue and displayed information of surface analysis instruments manufactured by ULVAC-PHI, Inc including XPS (X-ray Photo-Electron Spectroscopy), AES (Auger Electron Spectroscopy) and Tof-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry).

Mr Sanada had presented a talk titled as “Scanning XPS Microprobe to Support Advanced Inorganic and Organic Materials Analysis” in this conference. In this topic, Mr. Sanada had explained the principle of scanning X-ray photoelectron spectroscopy and its advantage. Meanwhile, he had also introduced the applications of IC assembly packaging micro-size jointing and fuel cells using the XPS tool for analysis, which provided all participants a deeper understanding on the advantages of Scanning XPS Microprobe.