News & Event

CMRS (China Material Research Society) exhibition had held in 2018-7 in the beautiful city of Xiamen, China. During the exhibition, hundreds of company participated in the exhibition booth to show their newest technologies in applications of different materials.

PHI China / CoreTech Integrated Limited had joint into the event as one of the supplier, in representing Surface Analysis technologies field. There was also a poster section in this exhibition, and surprisingly there are over 40 posters had utilized some part of surface analysis techniques such as XPS (X-ray Photo-electron Spectroscopy) or AES (Auger Electron Spectroscopy) to characterize some materials property hence in-help for research or product development purposes.

In this year, it has already been the 4th consecutive year that for PHI China to participate in this event. Our executive director, Mr. Wensly Yip, had a chance to present a talk during this time exhibition on the topic of “New material characterization method by Tandem Tof-SIMS analysis” which is another important technique in surface analysis field. Mr. Wensly Yip had explained how the tandem MS approach had given a completely different concept for the Tof-SIMS analysis. In ordinary Tof-SIMS, it already has the advantages such as being able to detect Hydrogen, very high detection limit until the ppm to ppb level, very fast parallel detection and also the sub-micron spatial resolution capabilities. Then the new tandem MS function added had dramatically help Tof-SIMS to be able to distinguish peaks in the high mass range (>200amu) with complete confidence.

PHI China / CoreTech Integrated Limited will always have the full dedication into the China market and target to provide the best surface analysis instrument and the after-sale service to all the users. We hope CMRS will continue its success while we would be proud to keep being part of the exhibition in every year.

Mr. Wensly Yip taken a photo at the CMRS exhibition at Xiamen

Discussion after the presentation with answering questions by Mr. Wensly Yip

Mr. Wensly Yip presented the topic “New material characterization method by Tandem Tof-SIMS analysis